dc.contributor.author | Sediva, Eva | |
dc.contributor.author | Defferriere, Thomas | |
dc.contributor.author | Perry, Nicola H. | |
dc.contributor.author | Tuller, Harry L. | |
dc.contributor.author | Rupp, Jennifer L. M. | |
dc.date.accessioned | 2022-03-16T14:33:33Z | |
dc.date.available | 2022-02-22T19:40:34Z | |
dc.date.available | 2022-03-16T14:33:33Z | |
dc.date.issued | 2019-06 | |
dc.date.submitted | 2019-05 | |
dc.identifier.issn | 0935-9648 | |
dc.identifier.issn | 1521-4095 | |
dc.identifier.uri | https://hdl.handle.net/1721.1/140594.2 | |
dc.language | en | |
dc.publisher | Wiley | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1002/adma.201902493 | en_US |
dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
dc.source | Wiley | en_US |
dc.title | In Situ Method Correlating Raman Vibrational Characteristics to Chemical Expansion via Oxygen Nonstoichiometry of Perovskite Thin Films | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Sediva, Eva, Defferriere, Thomas, Perry, Nicola H., Tuller, Harry L. and Rupp, Jennifer L. M. 2019. "In Situ Method Correlating Raman Vibrational Characteristics to Chemical Expansion via Oxygen Nonstoichiometry of Perovskite Thin Films." Advanced Materials, 31 (33). | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
dc.relation.journal | Advanced Materials | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.date.submission | 2022-02-09T20:37:32Z | |
mit.journal.volume | 31 | en_US |
mit.journal.issue | 33 | en_US |
mit.license | OPEN_ACCESS_POLICY | |
mit.metadata.status | Authority Work Needed | en_US |