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dc.contributor.authorWU, W.
dc.contributor.authorSCHÄUBLIN, R.
dc.date.accessioned2022-02-28T19:47:32Z
dc.date.available2022-02-28T16:31:27Z
dc.date.available2022-02-28T19:47:32Z
dc.date.issued2020-04
dc.date.submitted2020-02
dc.identifier.issn0022-2720
dc.identifier.issn1365-2818
dc.identifier.urihttps://hdl.handle.net/1721.1/140816.2
dc.languageen
dc.publisherWileyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1111/jmi.12884en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceWileyen_US
dc.titleSynergistic effects of anisotropy and image force on TEM diffraction contrast of dislocation loopsen_US
dc.typeArticleen_US
dc.identifier.citationWU, W. and SCHÄUBLIN, R. 2020. "Synergistic effects of anisotropy and image force on TEM diffraction contrast of dislocation loops." Journal of Microscopy, 278 (1).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.relation.journalJournal of Microscopyen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.date.submission2022-02-09T21:07:52Z
mit.journal.volume278en_US
mit.journal.issue1en_US
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work Neededen_US


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