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dc.contributor.authorKnorr, David Bruce.en_US
dc.date.accessioned2022-05-03T19:46:36Z
dc.date.available2022-05-03T19:46:36Z
dc.date.copyright1977en_US
dc.date.issued1977en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/142269
dc.descriptionThesis: M.S., Massachusetts Institute of Technology, Department of Materials Science and Engineering, 1977en_US
dc.descriptionIncludes bibliographical references.en_US
dc.format.extent189 leavesen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMaterials Science and Engineeringen_US
dc.subject.lcshX-ray crystallography.en_US
dc.subject.lcshZirconium alloys.en_US
dc.subject.lcshAnisotropy.en_US
dc.titleQuantitative characterization of crystallographic textures in zirconium-based alloys.en_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.identifier.oclc04173124en_US
dc.description.collectionM.S. Massachusetts Institute of Technology, Department of Materials Science and Engineeringen_US
dspace.imported2022-05-03T19:46:36Zen_US
mit.thesis.degreeMasteren_US


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