Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials
Author(s)
Miller, Matthew J.; Cabral, Matthew J.; Dickey, Elizabeth C.; LeBeau, James M.; Reich, Brian J.
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Show full item recordDate issued
2021-04Department
Massachusetts Institute of Technology. Department of Materials Science and EngineeringJournal
Technometrics
Publisher
Informa UK Limited
Citation
Miller, Matthew J, Cabral, Matthew J, Dickey, Elizabeth C, LeBeau, James M and Reich, Brian J. 2022. "Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials." Technometrics, 64 (1).
Version: Original manuscript
ISSN
0040-1706
1537-2723