| dc.contributor.author | Thomsen, Joachim Dahl | |
| dc.contributor.author | Reidy, Kate | |
| dc.contributor.author | Zarubin, Vera | |
| dc.contributor.author | Ross, Frances M | |
| dc.date.accessioned | 2022-08-19T14:58:28Z | |
| dc.date.available | 2022-08-19T14:58:28Z | |
| dc.date.issued | 2021 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/144371 | |
| dc.language.iso | en | |
| dc.publisher | Cambridge University Press (CUP) | en_US |
| dc.relation.isversionof | 10.1017/S1431927621013167 | en_US |
| dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
| dc.source | Joachim Dahl Thomsen | en_US |
| dc.title | Ultra High Vacuum Transmission Electron Microscopy of Metal/2D Material Contacts | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Thomsen, Joachim Dahl, Reidy, Kate, Zarubin, Vera and Ross, Frances M. 2021. "Ultra High Vacuum Transmission Electron Microscopy of Metal/2D Material Contacts." Microscopy and Microanalysis, 27 (S2). | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Brain and Cognitive Sciences | |
| dc.contributor.department | Massachusetts Institute of Technology. Research Laboratory of Electronics | |
| dc.relation.journal | Microscopy and Microanalysis | en_US |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dc.date.updated | 2022-08-19T14:47:38Z | |
| dspace.orderedauthors | Thomsen, JD; Reidy, K; Zarubin, V; Ross, FM | en_US |
| dspace.date.submission | 2022-08-19T14:47:39Z | |
| mit.journal.volume | 27 | en_US |
| mit.journal.issue | S2 | en_US |
| mit.license | OPEN_ACCESS_POLICY | |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |
