dc.contributor.advisor | James R. Melcher. | en_US |
dc.contributor.author | Zaretsky, Mark Carmeron | en_US |
dc.contributor.other | Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. | en_US |
dc.date.accessioned | 2005-08-08T21:53:48Z | |
dc.date.available | 2005-08-08T21:53:48Z | |
dc.date.copyright | 1987 | en_US |
dc.date.issued | 1988 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/14722 | |
dc.description | Thesis (Sc. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988. | en_US |
dc.description | Bibliography: v. 2, leaves 584-593. | en_US |
dc.description.statementofresponsibility | by Mark Cameron Zaretsky. | en_US |
dc.format.extent | 2 v. (593 leaves) | en_US |
dc.format.extent | 32444032 bytes | |
dc.format.extent | 32443791 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
dc.subject | Electrical Engineering and Computer Science. | en_US |
dc.title | Parameter estimation using microdielectrometry with application to transformer monitoring | en_US |
dc.type | Thesis | en_US |
dc.description.degree | Sc.D. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
dc.identifier.oclc | 18526981 | en_US |