Understanding the fundamental driver of semiconductor radiation tolerance with experiment and theory

Author(s)
Logan, Julie V; Webster, Preston T; Woller, Kevin B; Morath, Christian P; Short, Michael P
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Date issued
2022-08-08
URI
https://hdl.handle.net/1721.1/147619
Department
Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Journal
Physical Review Materials
Publisher
American Physical Society (APS)
Citation
Logan, Julie V, Webster, Preston T, Woller, Kevin B, Morath, Christian P and Short, Michael P. 2022. "Understanding the fundamental driver of semiconductor radiation tolerance with experiment and theory." Physical Review Materials, 6 (8).
Version: Final published version
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