| dc.contributor.advisor | Stephen D. Senturia. | en_US |
| dc.contributor.author | Allen, Mark George | en_US |
| dc.contributor.other | Massachusetts Institute of Technology. Dept. of Chemical Engineering. | en_US |
| dc.date.accessioned | 2005-08-08T17:05:01Z | |
| dc.date.available | 2005-08-08T17:05:01Z | |
| dc.date.copyright | 1986 | en_US |
| dc.date.issued | 1986 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/15052 | |
| dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Chemical Engineering, 1986. | en_US |
| dc.description | MICROFICHE COPY AVAILABLE IN ARCHIVES AND SCIENCE. | en_US |
| dc.description | Bibliography: leaves 113-115. | en_US |
| dc.description.statementofresponsibility | by Mark George Allen. | en_US |
| dc.format.extent | 132 leaves | en_US |
| dc.format.extent | 6574408 bytes | |
| dc.format.extent | 6574166 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Chemical Engineering. | en_US |
| dc.title | Measurement of mechanical properties and adhesion of thin polyimide films | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M.S. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Chemical Engineering | |
| dc.identifier.oclc | 15506070 | en_US |