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dc.contributor.authorWeinstein, William Winiker.en_US
dc.date.accessioned2023-08-07T18:38:55Z
dc.date.available2023-08-07T18:38:55Z
dc.date.copyright1972en_US
dc.date.issued1972en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/151742
dc.descriptionThesis: M.S., Massachusetts Institute of Technology, Department of Aeronautics and Astronautics, 1972en_US
dc.descriptionBibliography: leaves 88-89.en_US
dc.format.extent89 leavesen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectAeronautics and Astronauticsen_US
dc.titleCorrelated malfunctions in redundant systems.en_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Aeronautics and Astronauticsen_US
dc.identifier.oclc29144740en_US
dc.description.collectionM.S. Massachusetts Institute of Technology, Department of Aeronautics and Astronauticsen_US
dspace.imported2023-08-07T18:38:55Zen_US
mit.thesis.degreeMasteren_US


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