| dc.contributor.advisor | Steven Dubowsky. | en_US |
| dc.contributor.author | Wander, Joseph M | en_US |
| dc.contributor.other | Massachusetts Institute of Technology. Dept. of Mechanical Engineering. | en_US |
| dc.date.accessioned | 2005-08-05T20:47:43Z | |
| dc.date.available | 2005-08-05T20:47:43Z | |
| dc.date.copyright | 1985 | en_US |
| dc.date.issued | 1985 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/15264 | |
| dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1985. | en_US |
| dc.description | MICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERING. | en_US |
| dc.description | Includes bibliographical references. | en_US |
| dc.description.statementofresponsibility | by Joseph M. Wander. | en_US |
| dc.format.extent | 258 [i.e. 262] leaves | en_US |
| dc.format.extent | 14618654 bytes | |
| dc.format.extent | 14618408 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Mechanical Engineering. | en_US |
| dc.title | The application of Moire interferometry to automated 3-dimensional inspection | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M.S. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | |
| dc.identifier.oclc | 13364297 | en_US |
