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Intensity measurements in the arc spectrum of copper using the diffraction grating

dc.contributor.advisorGeorge R. Harrison.
dc.contributor.authorSmyth, Harold Thomas, 1910-en_US
dc.date.accessioned2024-06-11T14:06:46Z
dc.date.available2024-06-11T14:06:46Z
dc.date.copyright1937en_US
dc.date.issued1937en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/155235
dc.descriptionThesis: Ph. D., Massachusetts Institute of Technology, Department of Physics, 1937en_US
dc.descriptionIncludes bibliographical references (leaf 74).en_US
dc.description.statementofresponsibilityby Harold Thomas Smyth.en_US
dc.format.extent75, [3] leavesen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectPhysicsen_US
dc.titleIntensity measurements in the arc spectrum of copper using the diffraction gratingen_US
dc.typeThesisen_US
dc.description.degreePh. D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.identifier.oclc35515573en_US
dc.description.collectionPh. D. Massachusetts Institute of Technology, Department of Physicsen_US
dspace.imported2024-06-11T14:06:46Zen_US
mit.thesis.degreeDoctoralen_US


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