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dc.contributor.advisorAlan S. Willsky.en_US
dc.contributor.authorLou, Xi-Chengen_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2005-08-04T21:40:00Z
dc.date.available2005-08-04T21:40:00Z
dc.date.copyright1982en_US
dc.date.issued1982en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/15614
dc.descriptionThesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1982.en_US
dc.descriptionIncludes bibliographical references.en_US
dc.description.statementofresponsibilityby Xi-Cheng Lou.en_US
dc.format.extent[2], 90 leavesen_US
dc.format.extent3302157 bytes
dc.format.extent3301916 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineering and Computer Science.en_US
dc.subject.lcshSystem failures (Engineering)en_US
dc.subject.lcshSystem identificationen_US
dc.subject.lcshRedundancy (Engineering)en_US
dc.subject.lcshSystem designen_US
dc.titleA system failure detection method -- failure projection methoden_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc10058561en_US


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