| dc.contributor.advisor | Shavit, Nir N. | |
| dc.contributor.author | Sawmya, Shashata | |
| dc.date.accessioned | 2024-08-21T18:57:33Z | |
| dc.date.available | 2024-08-21T18:57:33Z | |
| dc.date.issued | 2024-05 | |
| dc.date.submitted | 2024-07-10T12:59:55.021Z | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/156333 | |
| dc.description.abstract | Smart Electron Microscopy (SmartEM) is a new generation EM imaging technology that promises to revolutionize microscopy. In this research, we explore the integration of advanced techniques to enhance this technology further. These include alternative characterization of high-resolution rescanning, cutting-edge vision models, incorporation of 3D information and vision transformers for improved neuronal segmentation and pipeline speedup. Our goal is to develop tools that improve the existing SmartEM pipeline, making it more versatile and effective for deployment in various practical settings. | |
| dc.publisher | Massachusetts Institute of Technology | |
| dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0) | |
| dc.rights | Copyright retained by author(s) | |
| dc.rights.uri | https://creativecommons.org/licenses/by-nc-nd/4.0/ | |
| dc.title | Next generation tools for smart electron microscopy | |
| dc.type | Thesis | |
| dc.description.degree | S.M. | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| mit.thesis.degree | Master | |
| thesis.degree.name | Master of Science in Electrical Engineering and Computer Science | |
