dc.contributor.advisor | Alan S. Willsky. | en_US |
dc.contributor.author | Chow, Edward Yik | en_US |
dc.contributor.other | Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. | en_US |
dc.date.accessioned | 2005-08-04T17:46:19Z | |
dc.date.available | 2005-08-04T17:46:19Z | |
dc.date.copyright | 1980 | en_US |
dc.date.issued | 1981 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/15879 | |
dc.description | Thesis (Sc.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1981. | en_US |
dc.description | MICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERING. | en_US |
dc.description | Includes bibliographical references. | en_US |
dc.description.statementofresponsibility | by Edward Yik Chow. | en_US |
dc.format.extent | 232 leaves | en_US |
dc.format.extent | 11732579 bytes | |
dc.format.extent | 11732335 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
dc.subject | Electrical Engineering and Computer Science. | en_US |
dc.subject.lcsh | System design | en_US |
dc.subject.lcsh | System identification | en_US |
dc.subject.lcsh | Sequential analysis | en_US |
dc.subject.lcsh | Redundancy (Engineering) | en_US |
dc.subject.lcsh | Robust statistics | en_US |
dc.title | A failure detection system design methodology | en_US |
dc.type | Thesis | en_US |
dc.description.degree | Sc.D. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
dc.identifier.oclc | 08206371 | en_US |