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Renewal process and diffusion models of 1/f noise

dc.contributor.advisorW.M. Siebert and R.B. Adler.en_US
dc.contributor.authorKeshner, Marvin Stuarten_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2005-08-04T15:52:01Z
dc.date.available2005-08-04T15:52:01Z
dc.date.copyright1979en_US
dc.date.issued1979en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/16024
dc.descriptionThesis (Sc.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1979.en_US
dc.descriptionMICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERING.en_US
dc.descriptionBibliography: leaves 99-108.en_US
dc.description.statementofresponsibilityby Marvin Stuart Keshner.en_US
dc.format.extent108 leavesen_US
dc.format.extent5932731 bytes
dc.format.extent5932489 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineering and Computer Science.en_US
dc.subject.lcshElectric resistors, Filmen_US
dc.subject.lcshAutocorrelation (Statistics)en_US
dc.subject.lcshRandom noise theoryen_US
dc.subject.lcshPower spectraen_US
dc.titleRenewal process and diffusion models of 1/f noiseen_US
dc.typeThesisen_US
dc.description.degreeSc.D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc07224515en_US


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