dc.contributor.advisor | Berthold K.P. Horn. | en_US |
dc.contributor.author | Silver, William M | en_US |
dc.contributor.other | Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. | en_US |
dc.date.accessioned | 2005-08-04T16:37:14Z | |
dc.date.available | 2005-08-04T16:37:14Z | |
dc.date.issued | 1980 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/16136 | |
dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1980. | en_US |
dc.description | MICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERING. | en_US |
dc.description | Bibliography: leaves 113-115. | en_US |
dc.description.statementofresponsibility | by William Michael Silver. | en_US |
dc.format.extent | 115 leaves : ill. | en_US |
dc.format.extent | 8090996 bytes | |
dc.format.extent | 8090757 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
dc.subject | Electrical Engineering and Computer Science. | en_US |
dc.subject.lcsh | Image processing | en_US |
dc.subject.lcsh | Albedo | en_US |
dc.subject.lcsh | Photometry | en_US |
dc.subject.lcsh | Reflectance | en_US |
dc.subject.lcsh | Form perception | en_US |
dc.title | Determining shape and reflectance using multiple images | en_US |
dc.type | Thesis | en_US |
dc.description.degree | M.S. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
dc.identifier.oclc | 07903219 | en_US |