MIT Libraries logoDSpace@MIT

MIT
View Item 
  • DSpace@MIT Home
  • MIT Libraries
  • MIT Theses
  • Graduate Theses
  • View Item
  • DSpace@MIT Home
  • MIT Libraries
  • MIT Theses
  • Graduate Theses
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Noisy with a Chance of Mislabels: A Local and Training Dynamics Perspective on Detecting Label Noise in Deep Classification

Author(s)
Chentouf, A. Anas
Thumbnail
DownloadThesis PDF (6.593Mb)
Advisor
Ghassemi, Marzyeh
Terms of use
In Copyright - Educational Use Permitted Copyright retained by author(s) https://rightsstatements.org/page/InC-EDU/1.0/
Metadata
Show full item record
Abstract
Noisy labels are a pervasive challenge in modern supervised learning, especially in highstakes domains such as healthcare, where model reliability is critical. Detecting and mitigating the influence of mislabeled data is essential to improving both performance and interpretability. Building on insights from training dynamics, we propose Local Consistency across Training Epochs (LoCaTE), a class of data-filtering methods that leverages over-parameterized and over-trained neural networks to distinguish clean samples from mislabeled ones. Our approach integrates both local neighborhood information and the behavior of samples across training epochs to identify noise and enhance model robustness. We evaluate our method on real (human) and synthetic label noise across three classification datasets, finding that it achieves competitive F₁ of label error detection and improved downstream accuracy using a lightweight classifier with low added computational cost.
Date issued
2025-05
URI
https://hdl.handle.net/1721.1/162504
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology

Collections
  • Graduate Theses

Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

Login

Statistics

OA StatisticsStatistics by CountryStatistics by Department
MIT Libraries
PrivacyPermissionsAccessibilityContact us
MIT
Content created by the MIT Libraries, CC BY-NC unless otherwise noted. Notify us about copyright concerns.