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dc.contributor.authorChauhan, Vikash P
dc.contributor.authorSharp, Phillip A
dc.contributor.authorLanger, Robert
dc.date.accessioned2025-10-03T20:53:07Z
dc.date.available2025-10-03T20:53:07Z
dc.date.issued2025-09-17
dc.identifier.urihttps://hdl.handle.net/1721.1/162895
dc.description.abstractPrime editors make programmed genome modifications by writing new sequences into extensions of nicked DNA 3′ ends1. These edited 3′ new strands must displace competing 5′ strands to install edits, yet a bias towards retaining the competing 5′ strands hinders efficiency and can cause indel errors2. Here we discover that nicked end degradation, consistent with competing 5′ strand destabilization, can be promoted by Cas9-nickase mutations that relax nick positioning. We exploit this mechanism to engineer efficient prime editors with strikingly low indel errors. Combining this error-suppressing strategy with the latest efficiency-boosting architecture, we design a next-generation prime editor (vPE). Compared with previous editors, vPE features comparable efficiency yet up to 60-fold lower indel errors, enabling edit:indel ratios as high as 543:1.en_US
dc.language.isoen
dc.publisherSpringer Science and Business Media LLCen_US
dc.relation.isversionof10.1038/s41586-025-09537-3en_US
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivativesen_US
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/en_US
dc.sourceSpringer Science and Business Media LLCen_US
dc.titleEngineered prime editors with minimal genomic errorsen_US
dc.typeArticleen_US
dc.identifier.citationChauhan, V.P., Sharp, P.A. & Langer, R. Engineered prime editors with minimal genomic errors. Nature (2025).en_US
dc.contributor.departmentKoch Institute for Integrative Cancer Research at MITen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Biologyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemical Engineeringen_US
dc.relation.journalNatureen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2025-10-03T20:46:46Z
dspace.orderedauthorsChauhan, VP; Sharp, PA; Langer, Ren_US
dspace.date.submission2025-10-03T20:46:51Z
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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