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dc.contributor.advisorE.A. Von Hippel and E.B. Roberts.en_US
dc.contributor.authorLehmann, Walter Georgeen_US
dc.date.accessioned2005-08-02T19:40:03Z
dc.date.available2005-08-02T19:40:03Z
dc.date.issued1975en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/16451
dc.descriptionThesis. 1975. M.S.--Massachusetts Institute of Technology. Alfred P. Sloan School of Management.en_US
dc.descriptionBibliography: leaves 58-64.en_US
dc.description.statementofresponsibilityby Walter G. Lehmann.en_US
dc.format.extent84 leavesen_US
dc.format.extent5550117 bytes
dc.format.extent5549874 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectSloan School of Managementen_US
dc.subject.lcshElectron microscopesen_US
dc.subject.lcshNew products Case studiesen_US
dc.titleInnovation in electron microscopes and accessoriesen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentSloan School of Managementen_US
dc.identifier.oclc01942796en_US


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