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dc.contributor.authorShi, Jiaojian
dc.contributor.authorShen, Yuejun
dc.contributor.authorPan, Feng
dc.contributor.authorSun, Weiwei
dc.contributor.authorMangu, Anudeep
dc.contributor.authorShi, Cindy
dc.contributor.authorMcKeown-Green, Amy
dc.contributor.authorMoradifar, Parivash
dc.contributor.authorBawendi, Moungi G
dc.contributor.authorMoerner, WE
dc.contributor.authorDionne, Jennifer A
dc.contributor.authorLiu, Fang
dc.contributor.authorLindenberg, Aaron M
dc.date.accessioned2026-03-03T16:54:15Z
dc.date.available2026-03-03T16:54:15Z
dc.date.issued2024-04-08
dc.identifier.urihttps://hdl.handle.net/1721.1/164995
dc.description.abstractThe development of many quantum optical technologies depends on the availability of single quantum emitters with near-perfect coherence. Systematic improvement is limited by a lack of understanding of the microscopic energy flow at the single-emitter level and ultrafast timescales. Here we utilize a combination of fluorescence correlation spectroscopy and ultrafast spectroscopy to capture the sample-averaged dynamics of defects with single-particle sensitivity. We employ this approach to study heterogeneous emitters in two-dimensional hexagonal boron nitride. From milliseconds to nanoseconds, the translational, shelving, rotational and antibunching features are disentangled in time, which quantifies the normalized two-photon emission quantum yield. Leveraging the femtosecond resolution of this technique, we visualize electron–phonon coupling and discover the acceleration of polaronic formation on multi-electron excitation. Corroborated with theory, this translates to the photon fidelity characterization of cascaded emission efficiency and decoherence time. Our work provides a framework for ultrafast spectroscopy in heterogeneous emitters, opening new avenues of extreme-scale characterization for quantum applications.en_US
dc.language.isoen
dc.publisherSpringer Science and Business Media LLCen_US
dc.relation.isversionof10.1038/s41563-024-01855-7en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceOSTIen_US
dc.titleSolution-phase sample-averaged single-particle spectroscopy of quantum emitters with femtosecond resolutionen_US
dc.typeArticleen_US
dc.identifier.citationShi, J., Shen, Y., Pan, F. et al. Solution-phase sample-averaged single-particle spectroscopy of quantum emitters with femtosecond resolution. Nat. Mater. 23, 1063–1069 (2024).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.relation.journalNature Materialsen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2026-03-03T16:41:20Z
dspace.orderedauthorsShi, J; Shen, Y; Pan, F; Sun, W; Mangu, A; Shi, C; McKeown-Green, A; Moradifar, P; Bawendi, MG; Moerner, WE; Dionne, JA; Liu, F; Lindenberg, AMen_US
dspace.date.submission2026-03-03T16:41:23Z
mit.journal.volume23en_US
mit.journal.issue8en_US
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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