Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan
Author(s)
Finan, William F
DownloadJP-WP-93-01-27732004.pdf (2.365Mb)
Other Contributors
MIT Japan Program.
Metadata
Show full item recordDescription
Includes bibliographical references.
Date issued
1993Publisher
MIT Japan Program, Massachusetts Institute of Technology
Other identifiers
93-01
Series/Report no.
MITJP (Series) ; 93-01.