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dc.contributor.advisorSamir Nayfeh.en_US
dc.contributor.authorKelly, Darcy K. (Darcy Kendal), 1980-en_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Mechanical Engineering.en_US
dc.date.accessioned2005-06-02T19:13:59Z
dc.date.available2005-06-02T19:13:59Z
dc.date.copyright2004en_US
dc.date.issued2004en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/17931
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2004.en_US
dc.descriptionIncludes bibliographical references (leaf 68).en_US
dc.description.abstractThe target fabrication group at Lawrence Livermore National Laboratory develops various high energy density physics targets, which are used to study the interaction of materials when shot with high energy lasers. These targets consist of many different types of materials glued together including low density foams, plastics, and metals. To verify models, the physicists need to know the exact thickness of the targets and target components to [plus-minus] 1.0 [mu]m. The target components are typically 3-5 mm in diameter and 200-300 [mu]m thick and may have features such as moguls or two-dimensional sine waves machined onto them. As of yet, no commercial thickness measuring machine exists on the market capable of measuring thicknesses to [plus-minus] 1.0 [mu]m. To solve this problem, an absolute thickness measuring machine was developed that uses a precision air-bearing XY stage to scan a target between two confocal displacement lasers that measure the profile of each side of the target. A NIST traceable gage block of known thickness is used to calculate the thickness of the target. This paper describes the design and qualification of the absolute thickness measuring machine. It focuses on the error budget and tests performed to qualify the machine. Without compensation factors, the absolute thickness measuring machine was able to measure the thickness of a gage block to 0.5 [mu]m.en_US
dc.description.statementofresponsibilityby Darcy K. Kelly.en_US
dc.format.extent84 leavesen_US
dc.format.extent4976651 bytes
dc.format.extent4976458 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectMechanical Engineering.en_US
dc.titleDesign and qualification of an absolute thickness measuring machineen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.identifier.oclc56814018en_US


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