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dc.contributorBitran, Gabriel R.en_US
dc.contributorZhang, Li.en_US
dc.date.accessioned2003-04-29T04:55:21Z
dc.date.available2003-04-29T04:55:21Z
dc.date.issued1983en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/2030
dc.descriptionBibliography: p. 45.en_US
dc.description.statementofresponsibilityGabriel R. Bitran and Li Chang.en_US
dc.format.extent45 p.en_US
dc.format.extent2699670 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherAlfred P. Sloan School of Management, Massachusetts Institute of Technologyen_US
dc.relation.ispartofseriesWorking paper (Sloan School of Management) ; 1391-83.en_US
dc.subject.lccHD28 .M414 no.1391-, 83en_US
dc.titleProductivity measurement at the micro levelen_US


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