Sequential screening in semiconductor manufacturing.

Author(s)
Longtin, Mark D.; Wein, Lawrence M.; Welsch, Roy E.
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Description
Includes bibliographical references (p. 41-42).
Date issued
2003-04-29
URI
http://hdl.handle.net/1721.1/2427
Department
Massachusetts Institute of Technology. Operations Research Center
Publisher
Alfred P. Sloan School of Management, Massachusetts Institute of Technology, 1992.
Other identifiers
# 3452-92-MSA
Series/Report no.
Working paper (Sloan School of Management) ; 3452-92.
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