Goodness-of-fit tests for regression using kernel methods
Author(s)
Aït-Sahalia, Yacine.; Bickel, Peter J.; Stoker, Thomas M.
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Metadata
Show full item recordDescription
Cover title. Includes bibliographical references (p. 27-30).
Date issued
1994Publisher
Sloan School of Management], Massachusetts Institute of Technology
Other identifiers
#3747
Series/Report no.
Working paper (Sloan School of Management) ; 3747-94.