| dc.contributor.advisor | Donald E. Troxel and Carl V. Thompson. | en_US |
| dc.contributor.author | Alam, Syed Mohiul, 1975- | en_US |
| dc.contributor.other | Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. | en_US |
| dc.date.accessioned | 2005-09-06T19:49:12Z | |
| dc.date.available | 2005-09-06T19:49:12Z | |
| dc.date.copyright | 2004 | en_US |
| dc.date.issued | 2004 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/26722 | |
| dc.description | Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004. | en_US |
| dc.description | This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections. | en_US |
| dc.description | Includes bibliographical references (p. 195-204). | en_US |
| dc.description.statementofresponsibility | by Syed Mohiul Alam. | en_US |
| dc.format.extent | 204 p. | en_US |
| dc.format.extent | 3195793 bytes | |
| dc.format.extent | 3262614 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en_US | |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Electrical Engineering and Computer Science. | en_US |
| dc.title | Design tool and methodologies for interconnect reliability analysis in integrated circuits | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | Ph.D. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.identifier.oclc | 59553725 | en_US |
