Metrics : you are what you measure!

Author(s)
Hauser, John R.; Katz, Gerald M.; Sloan School of Management.; International Center for Research on the Management of Technology.
Thumbnail
DownloadSWP-4009-41890065.pdf (2.099Mb)
Metadata
Show full item record
Description
Title from cover. "January, 1998."
 
Includes bibliographical references (p. 26-27).
 
Date issued
1998
URI
http://hdl.handle.net/1721.1/2703
Publisher
Sloan School of Management, Massachusetts Institute of Technology
Other identifiers
#4009
Series/Report no.
WP (International Center for Research on the Management of Technology) ; 172-98Working paper (Sloan School of Management) ; WP 4009-98.
Collections