dc.contributor | Hauser, John R. | en_US |
dc.contributor | Katz, Gerald M. | en_US |
dc.contributor | Sloan School of Management. | en_US |
dc.contributor | International Center for Research on the Management of Technology. | en_US |
dc.date.accessioned | 2003-04-29T05:16:08Z | |
dc.date.available | 2003-04-29T05:16:08Z | |
dc.date.copyright | 1998 | en_US |
dc.date.issued | 1998 | en_US |
dc.identifier.other | #4009 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/2703 | |
dc.description | Title from cover. "January, 1998." | en_US |
dc.description | Includes bibliographical references (p. 26-27). | en_US |
dc.description.statementofresponsibility | John R. Hauser, Gerald M. Katz. | en_US |
dc.format.extent | 27 p. | en_US |
dc.format.extent | 2201647 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | en_US |
dc.publisher | Sloan School of Management, Massachusetts Institute of Technology | en_US |
dc.relation.ispartofseries | WP (International Center for Research on the Management of Technology) ; 172-98 | en_US |
dc.relation.ispartofseries | Working paper (Sloan School of Management) ; WP 4009-98. | en_US |
dc.subject.lcc | HD28 .M414 no.4009-98 | en_US |
dc.title | Metrics : you are what you measure! | en_US |