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dc.contributorHauser, John R.en_US
dc.contributorKatz, Gerald M.en_US
dc.contributorSloan School of Management.en_US
dc.contributorInternational Center for Research on the Management of Technology.en_US
dc.date.accessioned2003-04-29T05:16:08Z
dc.date.available2003-04-29T05:16:08Z
dc.date.copyright1998en_US
dc.date.issued1998en_US
dc.identifier.other#4009en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/2703
dc.descriptionTitle from cover. "January, 1998."en_US
dc.descriptionIncludes bibliographical references (p. 26-27).en_US
dc.description.statementofresponsibilityJohn R. Hauser, Gerald M. Katz.en_US
dc.format.extent27 p.en_US
dc.format.extent2201647 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherSloan School of Management, Massachusetts Institute of Technologyen_US
dc.relation.ispartofseriesWP (International Center for Research on the Management of Technology) ; 172-98en_US
dc.relation.ispartofseriesWorking paper (Sloan School of Management) ; WP 4009-98.en_US
dc.subject.lccHD28 .M414 no.4009-98en_US
dc.titleMetrics : you are what you measure!en_US


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