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dc.contributor.advisorH. Sebastian Seung.en_US
dc.contributor.authorLevine, Joseph H. (Joseph Henry), 1979-en_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2005-09-06T21:28:37Z
dc.date.available2005-09-06T21:28:37Z
dc.date.copyright2002en_US
dc.date.issued2004en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/27048
dc.descriptionThesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, June 2004.en_US
dc.descriptionIncludes bibliographical references (p. 61).en_US
dc.description.abstractShort term memory is often correlated with persistent changes in neuronal firing rates in response to transient inputs. This thesis models the persistent maintenance of an analog eye position signal by an oculomotor neural integrator receiving transient eye movement commands. We show analytically how using neurons with multiple bistable dendritic compartments can enhance the robustness of eye fixations to mistuning while reproducing the observed linear relationship between neuronal firing rates and eye position. We calculate the network dynamics and tolerance to mistuning. Finally, we demonstrate that dendritic bistability can improve robustness in a biophysically realistic network of conductance based neurons.en_US
dc.description.statementofresponsibilityby Joseph H. Levine.en_US
dc.format.extent61 p.en_US
dc.format.extent2330332 bytes
dc.format.extent2336059 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleFriction effects on collective mechanisms of short term memoryen_US
dc.typeThesisen_US
dc.description.degreeM.Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc56795468en_US


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