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Automatic test, configuration, and repair of cellular arrays.

dc.contributor.advisorE. Fredkin.en_US
dc.contributor.authorManning, Frank Blaseen_US
dc.date.accessioned2005-09-16T21:28:17Z
dc.date.available2005-09-16T21:28:17Z
dc.date.issued1975en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/27405
dc.descriptionThesis. 1975. Ph.D.--Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.descriptionVita.en_US
dc.descriptionBibliography: leaves 237-242.en_US
dc.format.extent243 leavesen_US
dc.format.extent15460888 bytes
dc.format.extent15460648 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineering and Computer Scienceen_US
dc.subject.lcshComputer storage devicesen_US
dc.subject.lcshComputer programmingen_US
dc.subject.lcshSequential machine theoryen_US
dc.subject.lcshComputers Circuitsen_US
dc.titleAutomatic test, configuration, and repair of cellular arrays.en_US
dc.typeThesisen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc02148871en_US


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