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Radio frequency identification (RFID) applications in semiconductor manufacturing

Author(s)
Cassett, David Ian, 1971-; Hopeman, Christopher William Chiu, 1976-
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Alternative title
Radio frequency identification applications in semiconductor manufacturing
Other Contributors
Massachusetts Institute of Technology. Engineering Systems Division.
Advisor
James B. Rice, Jr.
Terms of use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582
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Abstract
Radio frequency identification (RFID) has an enormous potential impact within the semiconductor supply chain, especially within semiconductor manufacturing. The end benefit of RFID will be in the mass serialization, and the subsequent tracking and tracing, of individual semiconductors, or what is referred to as Unit Level Traceability (ULT). Before all of the technical hurdles of ULT are overcome, however, there exists a host of other applications for RFID within semiconductor manufacturing. The identification of what can and what should be RFID-tagged and read, the analysis of how to collect this information and what to do with the data, and the implementation of some targeted opportunities will provides valuable information with regards to the technical and logistical hurdles of RFID within semiconductor manufacturing far before ULT becomes a reality.
Description
Thesis (M. Eng. in Logistics)--Massachusetts Institute of Technology, Engineering Systems Division, 2004.
 
Includes bibliographical references (p. 87).
 
Date issued
2004
URI
http://hdl.handle.net/1721.1/28503
Department
Massachusetts Institute of Technology. Engineering Systems Division
Publisher
Massachusetts Institute of Technology
Keywords
Engineering Systems Division.

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