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dc.contributor.advisorBrian Backer.en_US
dc.contributor.authorMahowald, Gregory M. (Gregory Mark), 1978-en_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2006-03-24T16:15:57Z
dc.date.available2006-03-24T16:15:57Z
dc.date.copyright2003en_US
dc.date.issued2003en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/29694
dc.descriptionThesis (M.Eng. and S.B.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2003.en_US
dc.descriptionIncludes bibliographical references (p. 81).en_US
dc.description.abstractThe current IR imaging modules developed by BAE SYSTEMS North America use a Thermal Electric Cooler (TEC) to stabilize the Focal Plane Array (FPA). An FPA is an array of microbolometers which are small vanadium oxide elements whose resistances are very sensitive to IR radiation. The ability to run an imaging module without the TEC results in significant reduction in FPA package size, power consumption and module costs. In order to run a module in such a way several variables have to be accounted for. Running the module in TEC-Less mode requires changing the bolometer current as well as adjusting corrective maps in accordance with changes in ambient temperature. This investigation looked at these adjustments in order to determine if TEC-Less imaging was viable for the modules developed at BAE systems. A spatial noise test is used to determine if the TEC-Less images are as good of quality as those taken under normal operation. The results show that TEC-Less imaging over large temperature ranges is possible, and with the adjustments developed in this report, produces images with only slightly higher spatial noise.en_US
dc.description.statementofresponsibilityby Gregory M. Mahowald.en_US
dc.format.extent94 p.en_US
dc.format.extent3178063 bytes
dc.format.extent3177869 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleInvestigation of thermal electric cooler-less microbolometer infrared imagingen_US
dc.title.alternativeInvestigation of TEC-less microbolometer infrared imagingen_US
dc.typeThesisen_US
dc.description.degreeM.Eng.and S.B.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc53883845en_US


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