dc.contributor.advisor | Joseph B. Bernstein. | en_US |
dc.contributor.author | Rasera, Roy L. (Roy Louis) | en_US |
dc.date.accessioned | 2006-03-29T18:22:02Z | |
dc.date.available | 2006-03-29T18:22:02Z | |
dc.date.copyright | 1995 | en_US |
dc.date.issued | 1995 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/32180 | |
dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995. | en_US |
dc.description | Includes bibliographical references (leaves 104-106). | en_US |
dc.description.statementofresponsibility | by Roy L. Rasera. | en_US |
dc.format.extent | 106 leaves | en_US |
dc.format.extent | 6432981 bytes | |
dc.format.extent | 6438915 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
dc.subject | Materials Science and Engineering | en_US |
dc.title | Laser linking of metal interconnect : process considerations and failure analysis using focused ion beam milling | en_US |
dc.type | Thesis | en_US |
dc.description.degree | M.S. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
dc.identifier.oclc | 34311938 | en_US |