Show simple item record

dc.contributor.advisorJoseph B. Bernstein.en_US
dc.contributor.authorRasera, Roy L. (Roy Louis)en_US
dc.date.accessioned2006-03-29T18:22:02Z
dc.date.available2006-03-29T18:22:02Z
dc.date.copyright1995en_US
dc.date.issued1995en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/32180
dc.descriptionThesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995.en_US
dc.descriptionIncludes bibliographical references (leaves 104-106).en_US
dc.description.statementofresponsibilityby Roy L. Rasera.en_US
dc.format.extent106 leavesen_US
dc.format.extent6432981 bytes
dc.format.extent6438915 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectMaterials Science and Engineeringen_US
dc.titleLaser linking of metal interconnect : process considerations and failure analysis using focused ion beam millingen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Dept. of Materials Science and Engineeringen_US
dc.identifier.oclc34311938en_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record