Misfit accomodation in thin films of Ni/Cu as measured by magnetic anisotropy
Author(s)
Inglefield, Heather Elizabeth![Thumbnail](/bitstream/handle/1721.1/32659/33328312-MIT.pdf.jpg?sequence=5&isAllowed=y)
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Advisor
Carl V. Thompson.
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Show full item recordDescription
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995. Includes bibliographical references (leaves 134-137).
Date issued
1995Department
Massachusetts Institute of Technology. Department of Materials Science and EngineeringPublisher
Massachusetts Institute of Technology
Keywords
Materials Science and Engineering