A new model for electric force microscopy and its application for electrostatically generated phase difference in tapping mode AFM

Author(s)
Stone, Peter (Peter Robert)
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Alternative title
New model for EFM microscopy and its application for electrostatically generated phase difference in tapping mode Atomic Force Microscope
Other Contributors
Massachusetts Institute of Technology. Dept. of Materials Science and Engineering.
Advisor
Francisco Stellacci.
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Abstract
The harmonic force balance method was used to model and simulate electric force microscopy (EFM) and electrostatically generated phase difference in tapping mode AFM (EPTA) measurements. Simulations show that the harmonic force balance approach matches and explains EFM and EPTA experimental results well. Simulations also show that the model depended on both geometric and materials parameters. The harmonic force balance model was subsequently used to directly simulate a previously performed EPTA experiment. Data obtained from the model showed a remarkable similarity to the experimentally obtained data, thus validating the use of the harmonic force balance model to simulate EPTA data.
Description
Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2005.
 
Includes bibliographical references (leaf 37).
 
Date issued
2005
URI
http://hdl.handle.net/1721.1/32855
Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Publisher
Massachusetts Institute of Technology
Keywords
Materials Science and Engineering.
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