Show simple item record

dc.contributor.advisorTrevor J. Darrell.en_US
dc.contributor.authorRoss, Benjamin Charlesen_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2006-07-13T15:16:42Z
dc.date.available2006-07-13T15:16:42Z
dc.date.copyright2004en_US
dc.date.issued2004en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/33341
dc.descriptionThesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.en_US
dc.descriptionIncludes bibliographical references (p. 109-110).en_US
dc.description.abstractIn this thesis, I explore the realm of feature-based object. recognition applied to landmark detection. I have built a system using SIFT object recognition and Locality-Sensitive Hashing to quickly and accurately detect landmarks with accuracies ranging from 85-95%. I have also compared PCA-SIFT, a newly developed feature descriptor, to SIFT, and have found that SIFT outperforms it only particular data set. In addition, I have, performed a relatively extensive empirical comparison between Locality-Sensitive Hashing and Best-Bin First, two approximate nearest neighbor searches, finding that Locality-Sensitive Hashing in general performs the best.en_US
dc.description.statementofresponsibilityby Benjamin Charles Ross.en_US
dc.format.extent110 p.en_US
dc.format.extent4941895 bytes
dc.format.extent4946485 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleAn analysis of SIFT object recognition with an emphasis on landmark detectionen_US
dc.typeThesisen_US
dc.description.degreeM.Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc62394676en_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record