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dc.contributor.advisorThomas W. Eagar.en_US
dc.contributor.authorWilliams, Joel C. (Joel Carlton)en_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Materials Science and Engineering.en_US
dc.date.accessioned2006-07-13T15:20:40Z
dc.date.available2006-07-13T15:20:40Z
dc.date.issued2005en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/33394
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2005.en_US
dc.description"June 2005."en_US
dc.descriptionIncludes bibliographical references (leaf 34).en_US
dc.description.abstractThis thesis describes a Pb-free solder alternative that is capable of fluxless bonding. The main advantage of this process is that it offers the benefits of low fabrication temperature (125⁰C) while producing a joint capable of withstanding low stresses at very high service temperatures (300⁰C+). The ternary alloy system of Bi-In-Sn was investigated in the bonding of copper substrates. All bonds were made at 125⁰C with 25psi of fixturing pressure. Primary solidification was observed in as little as 15 minutes. The mechanical properties of the joints were shear tested both at room temperature and at 1000C to simulate a conventional service environment. With sufficient dwell time ([approx.] 250h), joints would not fail in shear even at stresses that caused significant substrate deformation. Scanning electron microscopy was used to examine the joints and the evolution of the diffusion process.en_US
dc.description.statementofresponsibilityby Joel C. Williams.en_US
dc.format.extent34 leavesen_US
dc.format.extent1671492 bytes
dc.format.extent1672797 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectMaterials Science and Engineering.en_US
dc.titleLow temperature transient liquid phase bonding of copperen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.identifier.oclc62628313en_US


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