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dc.contributor.advisorHae-Seung Lee and Roger T. Howe.en_US
dc.contributor.authorKung, Joseph T. (Joseph Tze-Shew)en_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2006-11-06T16:00:56Z
dc.date.available2006-11-06T16:00:56Z
dc.date.copyright1987en_US
dc.date.issued1987en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/34304
dc.descriptionThesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1987.en_US
dc.descriptionBibliography: p. 107-113.en_US
dc.description.statementofresponsibilityby Joseph T. Kung.en_US
dc.format.extent[1], 113 p.en_US
dc.format.extent4417134 bytes
dc.format.extent4421822 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleA digital technique for precise measurement of capacitor differences, with application to capacitive integrated sensorsen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc17455811en_US


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