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dc.contributor.advisorStephen Graves and Dimitris Bertsimas.en_US
dc.contributor.authorKwong, William W. Men_US
dc.contributor.otherLeaders for Manufacturing Program.en_US
dc.date.accessioned2006-11-08T16:33:46Z
dc.date.available2006-11-08T16:33:46Z
dc.date.copyright2004en_US
dc.date.issued2004en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/34761
dc.descriptionThesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science; in conjunction with the Leaders for Manufacturing Program at MIT, 2004.en_US
dc.descriptionIncludes bibliographical references (leaf 62).en_US
dc.description.abstractEquipment management is an important driver behind operational efficiency, since capital equipment makes up about 40% of the average semiconductor manufacturer's total assets. The main goal of this project is to reduce variability in tool availability by planning for usage-driven preventive maintenance. A method and associated tools are proposed and investigated in the context of the Thin Films area in Intel's Hudson facility. The solution we propose incorporates the following characteristics: Drives towards a balanced preventive maintenance (PM) schedule such that PMs are evenly distributed in time; Enables fast recovery to a normal PM schedule after unexpected events occur on the factory floor, e.g. equipment breakdown, by re-distributing loads on each tool; Facilitates performance tracking and accountability; and Ensures consistency in the decision-making process. We will describe the conceptual method and the implementation process, from prototype deployment to the development of a production application. Alternative solutions using case-based reasoning and rule-based systems will also be discussed. We will conclude by discussing the role of automated decision systems in manufacturing and outline key issues to be considered in choosing an optimal design.en_US
dc.description.statementofresponsibilityby William Kwong.en_US
dc.format.extent69 leavesen_US
dc.format.extent2578146 bytes
dc.format.extent2583749 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectSloan School of Management.en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.subjectLeaders for Manufacturing Program.en_US
dc.titleReducing variability in equipment availability at Intel using systems optimizationen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.description.degreeM.B.A.en_US
dc.contributor.departmentLeaders for Manufacturing Program at MITen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.contributor.departmentSloan School of Management
dc.identifier.oclc56714339en_US


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