Show simple item record

dc.contributor.advisorCharles H. Fine and Daniel E. Whitney.en_US
dc.contributor.authorLin, Robert W. (Robert Wei-Pang), 1976-en_US
dc.contributor.otherLeaders for Manufacturing Program.en_US
dc.date.accessioned2006-11-08T16:39:11Z
dc.date.available2006-11-08T16:39:11Z
dc.date.copyright2004en_US
dc.date.issued2004en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/34793
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; in conjunction with the Leaders for Manufacturing Program at MIT, 2004.en_US
dc.descriptionIncludes bibliographical references (p. 82-84).en_US
dc.description.abstractAfter the market boom of 2000 in the semiconductor industry changed significantly. The changes included stricter limits on capital cost spending, and the increased propensity of the industry to outsource the manufacturing of semiconductors. Thus, the semiconductor industry demanded greater cost of test economics in semiconductor test equipment. In response to the changes in the industry and the customer demands, the semiconductor test industry segmented itself into two broad strategies. Typically, the large semiconductor test equipment manufacturers employed a broad platform strategy, while the smaller semiconductor test equipment manufacturers employed a niche platform strategy. This thesis confirms the underlying changes in the semiconductor test industry by looking at the entire semiconductor value chain. It also looks at the root causes of the changes in order to determine the future effects of the changes in the semiconductor test industry. This thesis also analyzes the two distinct market strategies, developing a systematic method to compare and evaluate each strategy. In addition, it explores the intangible risks associated with the adoption of each strategy. After understanding the trends in the semiconductor test industry, this thesis also presents a unified model to discuss the future direction of the semiconductor test industry. Looking at this direction, this project develops specific recommendations for businesses to compete effectively given the impending market conditions.en_US
dc.description.statementofresponsibilityby Robert W. Lin.en_US
dc.format.extent84 p.en_US
dc.format.extent5197216 bytes
dc.format.extent5197024 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectMechanical Engineering.en_US
dc.subjectSloan School of Management.en_US
dc.subjectLeaders for Manufacturing Program.en_US
dc.titleProduct strategy in response to technological innovation in the semiconductor test industryen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentLeaders for Manufacturing Program at MITen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.contributor.departmentSloan School of Management
dc.identifier.oclc56890738en_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record