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Semiconductor catalysis: simultaneous measurement of kinetics and surface electrical properties

dc.contributor.advisorRaymond F. Baddour.en_US
dc.contributor.authorMerrill, Robert Pen_US
dc.date.accessioned2006-11-16T11:18:57Z
dc.date.available2006-11-16T11:18:57Z
dc.date.issued1964en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/34881
dc.descriptionThesis (Sc. D.)--Massachusetts Institute of Technology, Dept. of Chemical Engineering, 1964.en_US
dc.descriptionIncludes bibliographical references (leaves 144-147).en_US
dc.description.statementofresponsibilityby Robert P. Merrill.en_US
dc.format.extent147, [34] leavesen_US
dc.format.extent6969662 bytes
dc.format.extent7320596 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectChemical Engineeringen_US
dc.titleSemiconductor catalysis: simultaneous measurement of kinetics and surface electrical propertiesen_US
dc.typeThesisen_US
dc.description.degreeSc.D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemical Engineering
dc.identifier.oclc34239745en_US


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