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dc.contributor.authorPeterson, Michael L. (Michael Laurel)en_US
dc.date.accessioned2007-01-10T16:05:09Z
dc.date.available2007-01-10T16:05:09Z
dc.date.copyright1994en_US
dc.date.issued1994en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/35418
dc.descriptionThesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1994, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering, 1994.en_US
dc.descriptionIncludes bibliographical references (p. 94-95).en_US
dc.description.statementofresponsibilityby Michael L. Peterson.en_US
dc.format.extent124 p.en_US
dc.format.extent7858627 bytes
dc.format.extent8292284 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectSloan School of Managementen_US
dc.subjectElectrical Engineeringen_US
dc.titleTesting for time-dependent failures in electronic productsen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineeringen_US
dc.contributor.departmentSloan School of Managementen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc31673724en_US


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