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dc.contributor.advisorEric W. Hudson.en_US
dc.contributor.authorVenkatachalam, Viveken_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Physics.en_US
dc.date.accessioned2007-02-21T11:27:44Z
dc.date.available2007-02-21T11:27:44Z
dc.date.copyright2006en_US
dc.date.issued2006en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/36116
dc.descriptionThesis (S.B.)--Massachusetts Institute of Technology, Dept. of Physics, 2006.en_US
dc.descriptionIncludes bibliographical references (leaf 25).en_US
dc.description.abstractOne of the largest problems in scanning tunneling microscopy design is noise control. It is the burden of the designer to determine if money should be used to build a floating room for vibration isolation or for top-of-the-line preamplifiers that can be placed at low temperatures. This thesis presents a simulation of the STM measurement chain, from tunneling tip to computer control. The goal is to see how noise at different stages of the measurement chain affect the output of spectroscopy (density of states) measurements. Specifically, we look at how spectroscopy measurements depend on the temperature of the sample, the density of states in the sample and tip, the shakiness of the tip, the noise present in the current preamplifier, and several other settings. Chapter 1 describes STM spectroscopy measurement, Chapter 2 explains how it is simulated, and Chapter 3 finally looks at the results of various simulations.en_US
dc.description.statementofresponsibilityby Vivek Venkatachalam.en_US
dc.format.extent25 leavesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectPhysics.en_US
dc.titleSimulating scanning tunneling microscope measurementsen_US
dc.typeThesisen_US
dc.description.degreeS.B.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physics
dc.identifier.oclc71844429en_US


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