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    • Mortality Dependence of Cu Dual Damascene Interconnects on Adjacent Segments 

      Chang, Choon Wai; Gan, C.L.; Thompson, Carl V.; Pey, Kin Leong; Choi, Wee Kiong; e.a. (2004-01)
      Electromigration experiments have been carried out on straight interconnects that have single vias at each end, and are divided into two segments by a via in the center ("dotted-I" structures). For dotted-i structures in ...