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TEM Study on the Evolution of Ge Nanocrystals in Si Oxide Matrix as a Function of Ge Concentration and the Si Reduction Process 

Chew, Han Guan; Choi, Wee Kiong; Foo, Y.L.; Chim, Wai Kin; Fitzgerald, Eugene A.; e.a. (2006-01)
Growth and evolution of germanium (Ge) nanocrystals embedded into a silicon oxide (SiO₂) system have been studied based on the Ge content of co-sputtered Ge-SiO₂ films using transmission electron microscopy (TEM) and X-ray ...

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AuthorChew, Han Guan (1)Chim, Wai Kin (1)
Choi, Wee Kiong (1)
Fitzgerald, Eugene A. (1)
Foo, Y.L. (1)
Samanta, S.K. (1)
Seow, K.C. (1)
Voon, Z.J. (1)Zheng, F. (1)Subject
Germanium diffusion (1)
Germanium nanocrystals (1)
Silicon reduction (1)... View MoreDate Issued
2006 (1)
Has File(s)Yes (1)

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