Browsing Advanced Materials for Micro- and Nano-Systems (AMMNS) by Subject "High-K Gate Dielectrics"

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    • First-Principles Study of Point Defects in LaAlO₃ 

      Zheng, J.X.; Ceder, Gerbrand; Chim, Wai Kin; Choi, Wee Kiong (2007-01)
      In this study, the native point defects including oxygen vacancy and interstitial, metal (La, Al) vacancy and interstitial, and metal antisite in perovskite LAO are studied. Defect formation energies are studied as a ...