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dc.contributor.advisorFiona Murray.en_US
dc.contributor.authorMurray, Philip (Philip E.)en_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Mechanical Engineering.en_US
dc.date.accessioned2007-03-12T17:47:48Z
dc.date.available2007-03-12T17:47:48Z
dc.date.copyright2006en_US
dc.date.issued2006en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/36723
dc.descriptionThesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2006.en_US
dc.descriptionIncludes bibliographical references (leaves 33-34).en_US
dc.description.abstractIn this study, we explore the impact of gene-based patents on the pricing and availability of genetic diagnostic tests. We also explore the nature and scope of the genetic diagnostics industry itself. Through data mining of the GeneTests database and gathering of pricing and procedure information from over 51 laboratories (using a range of sources including phone interviews), we created a unique database that links pricing, procedure and availability information for each sequencing-based gene diagnostic test offered in the US. In addition, we linked relevant gene-based patents to each gene in our database. Our results indicate a correlation between gene patents and test pricing, with an average non-patented test price of -$1330.31 (121 entries) compared to an average price of -$1419.58 for tests associated with gene patents (137 entries).en_US
dc.description.statementofresponsibilityby Philip Murray.en_US
dc.format.extent34 leavesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectMechanical Engineering.en_US
dc.titleCreation of a database for evaluating the effect of genetic intellectual property on genetic diagnostic testingen_US
dc.typeThesisen_US
dc.description.degreeS.B.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.identifier.oclc77562281en_US


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