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dc.contributor.advisorDonald Rosenfield and David H. Marks.en_US
dc.contributor.authorSilber, Jacob B. (Jacob Bradley)en_US
dc.contributor.otherLeaders for Manufacturing Program.en_US
dc.date.accessioned2007-04-20T15:55:02Z
dc.date.available2007-04-20T15:55:02Z
dc.date.copyright2006en_US
dc.date.issued2006en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/37235
dc.descriptionThesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering; in conjunction with the Leaders for Manufacturing Program at MIT, 2006.en_US
dc.descriptionIncludes bibliographical references (p. 91-92).en_US
dc.description.abstractThe 6D program at Intel® Corporation was set up to improve operations around capital equipment reuse, primarily in their semiconductor manufacturing facilities. The company was faced with a number of challenges, including differing work flows across multiple locations, lack of centralized work flow management, discontinuous inventory information, and other opportunities for cost reduction. The internship was set up to benchmark and explore potential for integration of best known methods, accumulated both inside and outside the company. Based on interviews, research and quantitative analysis, opportunities were identified for reuse of equipment shipping crates, improvement in warehouse inventory management, and changes in labor models to facilitate better knowledge capture and dissemination. As a result of this study Intel® Corporation may realize significant improvement in the areas mentioned in terms of cost reduction, process improvement and knowledge management. By using a flexible approach to problem identification and generating organizational interest in the improvements, recommendations were well received and should lead to eventual adoption.en_US
dc.description.statementofresponsibilityby Jacob Silber.en_US
dc.format.extent92 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectSloan School of Management.en_US
dc.subjectCivil and Environmental Engineering.en_US
dc.subjectLeaders for Manufacturing Program.en_US
dc.titleImproving reuse of semiconductor equipment through benchmarking, standardization, and automationen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.description.degreeM.B.A.en_US
dc.contributor.departmentLeaders for Manufacturing Program at MITen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Civil and Environmental Engineering
dc.contributor.departmentSloan School of Management
dc.identifier.oclc85823890en_US


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