Testing of a first-generation dynamically programmable gate array

Author(s)
Tau, Edward F. (Edward Feiward)
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Advisor
Thomas F. Knight, Jr.
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Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
 
Includes bibliographical references (p. 57-58).
 
Date issued
1996
URI
http://hdl.handle.net/1721.1/40201
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science
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