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dc.contributor.advisorEdmund Bertschinger.en_US
dc.contributor.authorScolnic, Daniel (Daniel M.)en_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Physics.en_US
dc.date.accessioned2008-03-27T18:22:43Z
dc.date.available2008-03-27T18:22:43Z
dc.date.copyright2007en_US
dc.date.issued2007en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/40913
dc.descriptionThesis (S.B.)--Massachusetts Institute of Technology, Dept. of Physics, 2007.en_US
dc.descriptionIncludes bibliographical references (leaves 59-60).en_US
dc.description.abstractThe recombination of hydrogen at z ~ 800 - 1800 induces distortions to the Cosmic Microwave Background (CMB) spectrum. We present a careful calculation and analysis of all of the main transitions occurring during this period in order to find the electron density throughout recombination and its dependence on each process. Our original motivation was to analyze the effects that Thomson scattering and resonance scattering will have on recombination. However, while working on the project, we found that first we had to thoroughly account for all of the atomic transitions. We present a new method for solving the system of equations throughout the period of recombination. This method allows us to show the effect of individual processes on the total ionization fraction.en_US
dc.description.statementofresponsibilityby Daniel Scolnic.en_US
dc.format.extent60 leavesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectPhysics.en_US
dc.titleSolving the system of atomic rate equations during recombinationen_US
dc.typeThesisen_US
dc.description.degreeS.B.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physics
dc.identifier.oclc212376979en_US


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